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IEC 62951-2 (2019-04)

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IEC 62951-2 (2019-04)

IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

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IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin-film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.

Author IEC
Editor CEI
Document type Standard
Format File
Edition 1.0
ICS 31.080.99 : Other semiconductor devices
Number of pages 21
Year 2019
Country Switzerland
Keyword IEC62951;IEC 62951-2:2019