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IEC 62311 (2019-04) IEC 62311:2019...
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JEDEC JESD51-11TEST BOARDS FOR THROUGH-HOLE AREA ARRAY LEADED PACKAGE THERMAL MEASUREMENTstandard by JEDEC Solid State Technology Association, 06/01/2001
JEDEC JESD76-2STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (NORMAL RANGE OPERATION)standard by JEDEC Solid State Technology Association, 06/01/2001
JEDEC JESD72 (R2007)TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALSstandard by JEDEC Solid State Technology Association, 06/01/2001
JEDEC JEP139GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDINGstandard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD22-A102C (R2008)ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVEstandard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD 22-A118 (R2008)ACCELERATED MOISTURE RESISTANCE - UNBIASED HASTstandard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD64-ASTANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES WITH 3.6 V CMOS TOLERANT INPUTS AND OUTPUTSstandard by JEDEC Solid State Technology Association, 10/01/2000
JEDEC JESD51-10TEST BOARDS FOR THROUGH-HOLE PERIMETER LEADED PACKAGE THERMAL MEASUREMENTSstandard by JEDEC Solid State Technology Association, 07/01/2000
JEDEC JESD51-9TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTSstandard by JEDEC Solid State Technology Association, 07/01/2000
JEDEC JESD82DEFINITION OF CDCV857 PLL CLOCK DRIVER FOR REGISTERED DDR DIMM APPLICATIONSstandard by JEDEC Solid State Technology Association, 07/01/2000
JEDEC JEP120-AINDEX OF TERMS DEFINED IN JEDEC PUBLICATIONSstandard by JEDEC Solid State Technology Association, 05/01/2000
JEDEC JESD76DESCRIPTION OF 1.8 V CMOS LOGIC DEVICESstandard by JEDEC Solid State Technology Association, 04/01/2000