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EIA JESD 22-C101F:2013 Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
EIA JEP 70C:2013 Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
EIA JESD 49A.01:2013 Procurement Standard for Semiconductor Die Products Including Known Good Die (KGD)
EIA J-STD-042-B:2013 Emergency Alert Messaging for Cable
EIA/TIA-329.3-1:2013 Minimum Standards for Communications Antennas Part 3: Portable Antennas
TIA-455-204-A:2013 FOTP-204 Measurement of Bandwidth on Multimode Fiber
EIA/TIA-102.BAED:2013 Project 25 Packet Data Logical Link Control Procedures
EIA-364-29D:2019 TP-29D Contact Retention Test Procedure for Electrical Connectors
EIA-364-1000B:2019 TS-1000B Environmental Test Methodology for Assessing the Performance of Electrical Connectors and Sockets Used in Controlled Environment Applications
EIA-364-20F:2019 TP-20F Dielectric Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts
EIA JEP 143D:2019 Solid-State Reliability Assessment and Qualification Methodologies