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EIA CB-5:1969
EIA CB-5:1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
$32.44 $75.44 -57%In StockEIA-362:1969
EIA-362:1969 Tensile Properties of Magnetic Tape, Recm. Test Method R(1974)
$27.30 $63.48 -57%In StockEIA JEP 78:1969
EIA JEP 78:1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors
$20.57 $47.84 -57%In StockEIA-365:1969
EIA-365:1969 Performance Test Procedure for Solar Cells and Calibration Procedure for Solar Cell Standards for Space Vehicle Service
$18.59 $43.24 -57%In StockEIA-369:1969
EIA-369:1969 Midget I.F. Shields (.75 inch Square) (Reaffirmation of REC-144) R(1982)
$24.92 $57.96 -57%In StockEIA JEB 15:1969
EIA JEB 15:1969 Terminology and Methods of Measurement for Bistable Semiconductor Microcircuits
$43.12 $100.28 -57%In StockEIA JESD 353:1968 (R2009)
EIA JESD 353:1968 (R2009) The Measurement of Transistor Noise Figure at Frequencies up to 20 kHz by Sinusoidal Signal-Generator Method
$15.82 $36.80 -57%In StockEIA JESD 354:1968 (R2009)
EIA JESD 354:1968 (R2009) The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz
$15.82 $36.80 -57%In StockEIA RS-348:1968
EIA RS-348:1968 Magnetic Field Polarity, Including Definitions and Determination of Polarity
$26.11 $60.72 -57%In StockEIA-356:1968
EIA-356:1968 Definitions and Terminology in Connection with Record Changers and Manual Phonographs R(1973)
$26.11 $60.72 -57%In StockEIA JESD 340:1967 (R2009)
EIA JESD 340:1967 (R2009) Standard for the Measurement of CRE
$17.01 $39.56 -57%In StockEIA JESD 6:1967 (R2002)
EIA JESD 6:1967 (R2002) Measurement of Small Values of Transistor Capacitance
$18.59 $43.24 -57%In Stock
